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Back to topExtreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems) (Paperback)
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Description
Extreme Statistics in Memories.- Statistical Nano CMOS Variability and Its Impact on SRAM.- Importance Sampling-Based Estimation: Applications to Memory Design.- Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics.- Yield Estimation by Computing Probabilistic Hypervolumes.- Most Probable Point-Based Methods.- Extreme Value Theory: Application to Memory Statistics.
