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Analog IC Reliability in Nanometer CMOS (Analog Circuits and Signal Processing) (Paperback)

Analog IC Reliability in Nanometer CMOS (Analog Circuits and Signal Processing) Cover Image
By Elie Maricau, Georges Gielen
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Description

Introduction.- CMOS Reliability Overview.- Transistor Aging Compact Modeling.- Background on IC Reliability Simulation.- Analog IC Reliability Simulation.- Integrated Circuit Reliability.- Conclusions.

Product Details
ISBN: 9781489986306
ISBN-10: 1489986308
Publisher: Springer
Publication Date: June 19th, 2015
Pages: 198
Language: English
Series: Analog Circuits and Signal Processing
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