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Introduction to Quantum Metrology: The Revised Si System and Quantum Standards (Paperback)

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Description


Preface.- Theoretical Background of Quantum Metrology.- Measurements, Standards and Systems of Units.- The Revised SI System of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect and the Resistance Standard.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling.- Atomic Clocks and Time Scales.- Standards and Measurements of Length.- Satellite Navigation Systems.- Scanning Probe Microscopes.- New Standards of Mass.

About the Author


Waldemar Nawrocki is a professor of electronics at Poznan University of Technology, Poland, where he earned a Ph.D. in technical sciences in 1981. Dr. Nawrocki also holds a D.Sc. in physics from Jena University, Germany (since 1990). His research fields are: Quantum Metrology, Measurement System, Nanoelectronics and Cryoelectronics. W. Nawrocki has published 15 books. From 2006 to 2016 he has organized and chaired five international conferences on quantum metrology in Poznan.

Product Details
ISBN: 9783030196790
ISBN-10: 3030196798
Publisher: Springer
Publication Date: August 14th, 2020
Pages: 326
Language: English